[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/essderc/JaussSDNA15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/O._Ambacher>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._A._Jauss>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Noll>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Schwaiger>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/W._Daves>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSDERC.2015.7324712>
foaf:homepage <https://doi.org/10.1109/ESSDERC.2015.7324712>
dc:identifier DBLP conf/essderc/JaussSDNA15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSDERC.2015.7324712 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label Charge trapping in gate-drain access region of AlGaN/GaN MIS-HEMTs after drain stress. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/O._Ambacher>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._A._Jauss>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Noll>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Schwaiger>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/W._Daves>
swrc:pages 56-59 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/essderc/2015>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/essderc/JaussSDNA15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/essderc/JaussSDNA15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/essderc/essderc2015.html#JaussSDNA15>
rdfs:seeAlso <https://doi.org/10.1109/ESSDERC.2015.7324712>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/essderc>
dc:title Charge trapping in gate-drain access region of AlGaN/GaN MIS-HEMTs after drain stress. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document