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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/essderc/KaczerFWRBCDLGK15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ben_Kaczer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dimitri_Linten>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erik_Bury>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Francky_Catthoor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gerhard_Rzepa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guido_Groeseneken>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Halil_Kukner>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jacopo_Franco>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Moonju_Cho>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Philippe_Roussel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pieter_Weckx>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Praveen_Raghavan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robin_Degraeve>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tibor_Grasser>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wolfgang_G%E2%88%9A%E2%88%82s>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSDERC.2015.7324754>
foaf:homepage <https://doi.org/10.1109/ESSDERC.2015.7324754>
dc:identifier DBLP conf/essderc/KaczerFWRBCDLGK15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSDERC.2015.7324754 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label The defect-centric perspective of device and circuit reliability - From individual defects to circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ben_Kaczer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dimitri_Linten>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erik_Bury>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Francky_Catthoor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gerhard_Rzepa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guido_Groeseneken>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Halil_Kukner>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jacopo_Franco>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Moonju_Cho>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Philippe_Roussel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pieter_Weckx>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Praveen_Raghavan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robin_Degraeve>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tibor_Grasser>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wolfgang_G%E2%88%9A%E2%88%82s>
swrc:pages 218-225 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/essderc/2015>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/essderc/KaczerFWRBCDLGK15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/essderc/KaczerFWRBCDLGK15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/essderc/essderc2015.html#KaczerFWRBCDLGK15>
rdfs:seeAlso <https://doi.org/10.1109/ESSDERC.2015.7324754>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/essderc>
dc:title The defect-centric perspective of device and circuit reliability - From individual defects to circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document