Understanding Distance-Dependent Variations for Analog Circuits in a FinFET Technology.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/essderc/MadhusudanPSSKSH23
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/essderc/MadhusudanPSSKSH23
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Arvind_K._Sharma
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jitesh_Poojary
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kishor_Kunal
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Meghna_Madhusudan
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ramesh_Harjani
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ramprasath_S_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sachin_S._Sapatnekar
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FESSDERC59256.2023.10268572
>
foaf:
homepage
<
https://doi.org/10.1109/ESSDERC59256.2023.10268572
>
dc:
identifier
DBLP conf/essderc/MadhusudanPSSKSH23
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FESSDERC59256.2023.10268572
(xsd:string)
dcterms:
issued
2023
(xsd:gYear)
rdfs:
label
Understanding Distance-Dependent Variations for Analog Circuits in a FinFET Technology.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Arvind_K._Sharma
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jitesh_Poojary
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kishor_Kunal
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Meghna_Madhusudan
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ramesh_Harjani
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ramprasath_S_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sachin_S._Sapatnekar
>
swrc:
pages
69-72
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/essderc/2023
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/essderc/MadhusudanPSSKSH23/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/essderc/MadhusudanPSSKSH23
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/essderc/essderc2023.html#MadhusudanPSSKSH23
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ESSDERC59256.2023.10268572
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/essderc
>
dc:
title
Understanding Distance-Dependent Variations for Analog Circuits in a FinFET Technology.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document