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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/essderc/MontiRBGGBPCTVW14>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Antonio_Gnudi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/D._Varghese>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Elena_Gnani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/F._Monti>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gaetano_Barone>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giorgio_Baccarani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ming-Yeh_Chuang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rick_Wise>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stefano_Poli>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Susanna_Reggiani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Weidong_Tian>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSDERC.2014.6948828>
foaf:homepage <https://doi.org/10.1109/ESSDERC.2014.6948828>
dc:identifier DBLP conf/essderc/MontiRBGGBPCTVW14 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSDERC.2014.6948828 (xsd:string)
dcterms:issued 2014 (xsd:gYear)
rdfs:label TCAD analysis of HCS degradation in LDMOS devices under AC stress conditions. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Antonio_Gnudi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/D._Varghese>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Elena_Gnani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/F._Monti>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gaetano_Barone>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giorgio_Baccarani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ming-Yeh_Chuang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rick_Wise>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stefano_Poli>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Susanna_Reggiani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Weidong_Tian>
swrc:pages 333-336 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/essderc/2014>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/essderc/MontiRBGGBPCTVW14/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/essderc/MontiRBGGBPCTVW14>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/essderc/essderc2014.html#MontiRBGGBPCTVW14>
rdfs:seeAlso <https://doi.org/10.1109/ESSDERC.2014.6948828>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/essderc>
dc:title TCAD analysis of HCS degradation in LDMOS devices under AC stress conditions. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document