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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Didier_C%E2%88%9A%C2%A9li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marine_Couret>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSDERC53440.2021.9631828>
foaf:homepage <https://doi.org/10.1109/ESSDERC53440.2021.9631828>
dc:identifier DBLP conf/essderc/MukherjeeCMC21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSDERC53440.2021.9631828 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Impact of Hot Carrier Degradation on the Performances of Current Mirrors based on a 55 nm BiCMOS Integrated Circuit Technology. (xsd:string)
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swrc:pages 251-254 (xsd:string)
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dc:title Impact of Hot Carrier Degradation on the Performances of Current Mirrors based on a 55 nm BiCMOS Integrated Circuit Technology. (xsd:string)
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rdf:type swrc:InProceedings
rdf:type foaf:Document