Enhanced data integrity of In-Ga-Zn-Oxide based Capacitor-less 2T memory for DRAM applications.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/essderc/OhBPMRDDFKD21
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Enhanced data integrity of In-Ga-Zn-Oxide based Capacitor-less 2T memory for DRAM applications.
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