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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/essderc/PradeepKPJSGJG18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andre_Juge>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Emmanuel_Josse>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/G%E2%88%9A%C2%A9rard_Ghibaudo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gilles_Gouget>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Krishna_Pradeep>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Patrick_Scheer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Theano_A._Karatsori>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thierry_Poiroux>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSDERC.2018.8486847>
foaf:homepage <https://doi.org/10.1109/ESSDERC.2018.8486847>
dc:identifier DBLP conf/essderc/PradeepKPJSGJG18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSDERC.2018.8486847 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Analysis of Gate Current Wafer Level Variability in Advanced FD-SOI MOSFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andre_Juge>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Emmanuel_Josse>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/G%E2%88%9A%C2%A9rard_Ghibaudo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gilles_Gouget>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Krishna_Pradeep>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Patrick_Scheer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Theano_A._Karatsori>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thierry_Poiroux>
swrc:pages 242-245 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/essderc/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/essderc/PradeepKPJSGJG18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/essderc/PradeepKPJSGJG18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/essderc/essderc2018.html#PradeepKPJSGJG18>
rdfs:seeAlso <https://doi.org/10.1109/ESSDERC.2018.8486847>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/essderc>
dc:title Analysis of Gate Current Wafer Level Variability in Advanced FD-SOI MOSFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document