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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/essderc/ReggianiBGGPCTW12>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Antonio_Gnudi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Elena_Gnani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gaetano_Barone>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ming-Yeh_Chuang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rick_Wise>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stefano_Poli>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Susanna_Reggiani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Weidong_Tian>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSDERC.2012.6343364>
foaf:homepage <https://doi.org/10.1109/ESSDERC.2012.6343364>
dc:identifier DBLP conf/essderc/ReggianiBGGPCTW12 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSDERC.2012.6343364 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
rdfs:label TCAD degradation modeling for LDMOS transistors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Antonio_Gnudi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Elena_Gnani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gaetano_Barone>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ming-Yeh_Chuang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rick_Wise>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stefano_Poli>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Susanna_Reggiani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Weidong_Tian>
swrc:pages 185-188 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/essderc/2012>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/essderc/ReggianiBGGPCTW12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/essderc/ReggianiBGGPCTW12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/essderc/essderc2012.html#ReggianiBGGPCTW12>
rdfs:seeAlso <https://doi.org/10.1109/ESSDERC.2012.6343364>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/essderc>
dc:title TCAD degradation modeling for LDMOS transistors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document