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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/essderc/ScharfSHB19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christoph_Sohrmann>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Patrick_Scharf>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Steffen_Holland>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Volkhard_Beyer>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSDERC.2019.8901689>
foaf:homepage <https://doi.org/10.1109/ESSDERC.2019.8901689>
dc:identifier DBLP conf/essderc/ScharfSHB19 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSDERC.2019.8901689 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
rdfs:label Investigations on current filamentation in PIN diodes using TLP measurements and TCAD simulations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christoph_Sohrmann>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Patrick_Scharf>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Steffen_Holland>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Volkhard_Beyer>
swrc:pages 226-229 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/essderc/2019>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/essderc/ScharfSHB19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/essderc/ScharfSHB19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/essderc/essderc2019.html#ScharfSHB19>
rdfs:seeAlso <https://doi.org/10.1109/ESSDERC.2019.8901689>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/essderc>
dc:title Investigations on current filamentation in PIN diodes using TLP measurements and TCAD simulations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document