On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/essderc/SimoenAVJCAARTCF12
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On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs.
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