Experimental analysis of planar edge terminations for high voltage 4H-SiC devices.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/essderc/SolerBMMGRM15
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/essderc/SolerBMMGRM15
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Andrei_Mihaila
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_Mill%E2%88%9A%C2%B0n
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_Rebollo
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Josep_Montserrat
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Maxime_Berthou
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Philippe_Godignon
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Victor_Soler
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FESSDERC.2015.7324715
>
foaf:
homepage
<
https://doi.org/10.1109/ESSDERC.2015.7324715
>
dc:
identifier
DBLP conf/essderc/SolerBMMGRM15
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FESSDERC.2015.7324715
(xsd:string)
dcterms:
issued
2015
(xsd:gYear)
rdfs:
label
Experimental analysis of planar edge terminations for high voltage 4H-SiC devices.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Andrei_Mihaila
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_Mill%E2%88%9A%C2%B0n
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_Rebollo
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Josep_Montserrat
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Maxime_Berthou
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Philippe_Godignon
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Victor_Soler
>
swrc:
pages
68-71
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/essderc/2015
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/essderc/SolerBMMGRM15/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/essderc/SolerBMMGRM15
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/essderc/essderc2015.html#SolerBMMGRM15
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ESSDERC.2015.7324715
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/essderc
>
dc:
title
Experimental analysis of planar edge terminations for high voltage 4H-SiC devices.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document