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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/essderc/StanojevicHTK22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chen-Ming_Tsai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lee-Chi_Hung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Markus_Karner>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zlatan_Stanojevic>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSDERC55479.2022.9947117>
foaf:homepage <https://doi.org/10.1109/ESSDERC55479.2022.9947117>
dc:identifier DBLP conf/essderc/StanojevicHTK22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSDERC55479.2022.9947117 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label A Novel Approach to Modeling Insulator Wave-Function Penetration and Interface Roughness Scattering in MOSFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chen-Ming_Tsai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lee-Chi_Hung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Markus_Karner>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zlatan_Stanojevic>
swrc:pages 273-276 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/essderc/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/essderc/StanojevicHTK22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/essderc/StanojevicHTK22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/essderc/essderc2022.html#StanojevicHTK22>
rdfs:seeAlso <https://doi.org/10.1109/ESSDERC55479.2022.9947117>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/essderc>
dc:title A Novel Approach to Modeling Insulator Wave-Function Penetration and Interface Roughness Scattering in MOSFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document