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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/essderc/StradiottoPOG15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Clemens_Ostermaier>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gregor_Pobegen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Roberta_Stradiotto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tibor_Grasser>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSDERC.2015.7324716>
foaf:homepage <https://doi.org/10.1109/ESSDERC.2015.7324716>
dc:identifier DBLP conf/essderc/StradiottoPOG15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSDERC.2015.7324716 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label On the fly characterization of charge trapping phenomena at GaN/dielectric and GaN/AlGaN/dielectric interfaces using impedance measurements. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Clemens_Ostermaier>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gregor_Pobegen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Roberta_Stradiotto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tibor_Grasser>
swrc:pages 72-75 (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/essderc/essderc2015.html#StradiottoPOG15>
rdfs:seeAlso <https://doi.org/10.1109/ESSDERC.2015.7324716>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/essderc>
dc:title On the fly characterization of charge trapping phenomena at GaN/dielectric and GaN/AlGaN/dielectric interfaces using impedance measurements. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document