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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/essderc/SuLFXWCCHH23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chang_Su>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaifeng_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Liang_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Puyang_Cai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qianqian_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ru_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shaodi_Xu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhiyuan_Fu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhongxin_Liang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSDERC59256.2023.10268479>
foaf:homepage <https://doi.org/10.1109/ESSDERC59256.2023.10268479>
dc:identifier DBLP conf/essderc/SuLFXWCCHH23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSDERC59256.2023.10268479 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label New Insights into Read Current Margin and Memory Window of HfO2-based Ferroelectric FET with Re-exploration of the Role of Ferroelectric Dynamics and Interface Charges during Readout. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chang_Su>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaifeng_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Liang_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Puyang_Cai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qianqian_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ru_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shaodi_Xu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhiyuan_Fu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhongxin_Liang>
swrc:pages 89-92 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/essderc/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/essderc/SuLFXWCCHH23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/essderc/SuLFXWCCHH23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/essderc/essderc2023.html#SuLFXWCCHH23>
rdfs:seeAlso <https://doi.org/10.1109/ESSDERC59256.2023.10268479>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/essderc>
dc:title New Insights into Read Current Margin and Memory Window of HfO2-based Ferroelectric FET with Re-exploration of the Role of Ferroelectric Dynamics and Interface Charges during Readout. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document