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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/esweek/BreierJ15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dirmanto_Jap>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jakub_Breier>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F2818362.2818367>
foaf:homepage <https://doi.org/10.1145/2818362.2818367>
dc:identifier DBLP conf/esweek/BreierJ15 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F2818362.2818367 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dirmanto_Jap>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jakub_Breier>
swrc:pages 5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/esweek/2015wess>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/esweek/BreierJ15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/esweek/BreierJ15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/esweek/wess2015.html#BreierJ15>
rdfs:seeAlso <https://doi.org/10.1145/2818362.2818367>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/esweek>
dc:title Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document