Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/esweek/BreierJ15
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/esweek/BreierJ15
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Dirmanto_Jap
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jakub_Breier
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1145%2F2818362.2818367
>
foaf:
homepage
<
https://doi.org/10.1145/2818362.2818367
>
dc:
identifier
DBLP conf/esweek/BreierJ15
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1145%2F2818362.2818367
(xsd:string)
dcterms:
issued
2015
(xsd:gYear)
rdfs:
label
Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Dirmanto_Jap
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jakub_Breier
>
swrc:
pages
5
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/esweek/2015wess
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/esweek/BreierJ15/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/esweek/BreierJ15
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/esweek/wess2015.html#BreierJ15
>
rdfs:
seeAlso
<
https://doi.org/10.1145/2818362.2818367
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/esweek
>
dc:
title
Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document