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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/esweek/Koopman10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Philip_Koopman>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1930277.1930282>
foaf:homepage <https://doi.org/10.1145/1930277.1930282>
dc:identifier DBLP conf/esweek/Koopman10 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1930277.1930282 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Risk areas in embedded software industry projects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Philip_Koopman>
swrc:pages 5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/esweek/2010wese>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/esweek/Koopman10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/esweek/Koopman10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/esweek/wese2010.html#Koopman10>
rdfs:seeAlso <https://doi.org/10.1145/1930277.1930282>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/esweek>
dc:title Risk areas in embedded software industry projects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document