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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/etd2000/RadhakrishnanAVS95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/N._Achutan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._Santoshkumar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Verghese>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/V._Radhakrishnan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETD.1995.403509>
foaf:homepage <https://doi.org/10.1109/ETD.1995.403509>
dc:identifier DBLP conf/etd2000/RadhakrishnanAVS95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETD.1995.403509 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label A new approach to the measurement of surface roughness using the pulse-jet capacitance method. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/N._Achutan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._Santoshkumar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Verghese>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/V._Radhakrishnan>
swrc:pages 294-300 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/etd2000/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/etd2000/RadhakrishnanAVS95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/etd2000/RadhakrishnanAVS95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/etd2000/etd2000-1995.html#RadhakrishnanAVS95>
rdfs:seeAlso <https://doi.org/10.1109/ETD.1995.403509>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/etd2000>
dc:title A new approach to the measurement of surface roughness using the pulse-jet capacitance method. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document