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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/etfa/CanutoM06b>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Enrico_S._Canuto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fabio_Musso>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETFA.2006.355348>
foaf:homepage <https://doi.org/10.1109/ETFA.2006.355348>
dc:identifier DBLP conf/etfa/CanutoM06b (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETFA.2006.355348 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Embedded Model Control: Application to Interferometric Metrology Lines. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Enrico_S._Canuto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fabio_Musso>
swrc:pages 493-500 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/etfa/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/etfa/CanutoM06b/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/etfa/CanutoM06b>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/etfa/etfa2006.html#CanutoM06b>
rdfs:seeAlso <https://doi.org/10.1109/ETFA.2006.355348>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/etfa>
dc:title Embedded Model Control: Application to Interferometric Metrology Lines. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document