Test, Reliability and Functional Safety Trends for Automotive System-on-Chip.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ets/AngioneAAABBCSF22
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/ets/AngioneAAABBCSF22
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Annachiara_Ruospo
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Corrado_De_Sio
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Davide_Appello
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ernesto_S%E2%88%9A%C2%B0nchez_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Francesco_Angione
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Gabriele_Gavarini
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Giovanni_Squillero
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Giusy_Iaria
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/J._Aribido
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/J._Guerrero
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jyotika_Athavale
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Luca_Sterpone
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Martin_Huch
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Matteo_Sonza_Reorda
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Nicol%E2%88%9A%E2%89%A4_Bellarmino
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Paolo_Bernardi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Raffaele_Martone
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Riccardo_Cantoro
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Riccardo_Mariani
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Roberto_Ugioli
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Tobias_Kilian
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Tommaso_Foscale
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ulf_Schlichtmann
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Vincenzo_Tancorre
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FETS54262.2022.9810388
>
foaf:
homepage
<
https://doi.org/10.1109/ETS54262.2022.9810388
>
dc:
identifier
DBLP conf/ets/AngioneAAABBCSF22
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FETS54262.2022.9810388
(xsd:string)
dcterms:
issued
2022
(xsd:gYear)
rdfs:
label
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Annachiara_Ruospo
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Corrado_De_Sio
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Davide_Appello
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ernesto_S%E2%88%9A%C2%B0nchez_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Francesco_Angione
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Gabriele_Gavarini
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Giovanni_Squillero
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Giusy_Iaria
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/J._Aribido
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/J._Guerrero
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jyotika_Athavale
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Luca_Sterpone
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Martin_Huch
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Matteo_Sonza_Reorda
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Nicol%E2%88%9A%E2%89%A4_Bellarmino
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Paolo_Bernardi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Raffaele_Martone
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Riccardo_Cantoro
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Riccardo_Mariani
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Roberto_Ugioli
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Tobias_Kilian
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Tommaso_Foscale
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ulf_Schlichtmann
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Vincenzo_Tancorre
>
swrc:
pages
1-10
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/ets/2022
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/ets/AngioneAAABBCSF22/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/ets/AngioneAAABBCSF22
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/ets/ets2022.html#AngioneAAABBCSF22
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ETS54262.2022.9810388
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/ets
>
dc:
title
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document