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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/AngioneBFRATU22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Davide_Appello>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Francesco_Angione>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gabriele_Filipponi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matteo_Sonza_Reorda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Paolo_Bernardi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Roberto_Ugioli>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vincenzo_Tancorre>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETS54262.2022.9810396>
foaf:homepage <https://doi.org/10.1109/ETS54262.2022.9810396>
dc:identifier DBLP conf/ets/AngioneBFRATU22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETS54262.2022.9810396 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Davide_Appello>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Francesco_Angione>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gabriele_Filipponi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matteo_Sonza_Reorda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Paolo_Bernardi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Roberto_Ugioli>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vincenzo_Tancorre>
swrc:pages 1-6 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/ETS54262.2022.9810396>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:title An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document