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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/Arumi-DelgadoRG03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daniel_Arum%E2%88%9A%E2%89%A0-Delgado>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guido_Gronthoud>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_Pineda_de_Gyvez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rosa_Rodr%E2%88%9A%E2%89%A0guez-Monta%E2%88%9A%C4%AA%E2%88%9A%C2%A9s>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETW.2003.1231673>
foaf:homepage <https://doi.org/10.1109/ETW.2003.1231673>
dc:identifier DBLP conf/ets/Arumi-DelgadoRG03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETW.2003.1231673 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Process-variability aware delay fault testing of őĒVT and weak-open defects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daniel_Arum%E2%88%9A%E2%89%A0-Delgado>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guido_Gronthoud>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_Pineda_de_Gyvez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rosa_Rodr%E2%88%9A%E2%89%A0guez-Monta%E2%88%9A%C4%AA%E2%88%9A%C2%A9s>
swrc:pages 85-90 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/ETW.2003.1231673>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:title Process-variability aware delay fault testing of őĒVT and weak-open defects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document