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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/CosterHPSCMACB16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Brad_Snyder>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bryan_Bolt>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erik_Jan_Marinissen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hongtao_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeroen_De_Coster>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joris_Van_Campenhout>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marianna_Pantouvaki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peter_De_Heyn>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Philippe_Absil>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETS.2016.7519306>
foaf:homepage <https://doi.org/10.1109/ETS.2016.7519306>
dc:identifier DBLP conf/ets/CosterHPSCMACB16 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETS.2016.7519306 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
rdfs:label Test-station for flexible semi-automatic wafer-level silicon photonics testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Brad_Snyder>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bryan_Bolt>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erik_Jan_Marinissen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hongtao_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jeroen_De_Coster>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joris_Van_Campenhout>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marianna_Pantouvaki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peter_De_Heyn>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Philippe_Absil>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ets/2016>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ets/CosterHPSCMACB16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ets/CosterHPSCMACB16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ets/ets2016.html#CosterHPSCMACB16>
rdfs:seeAlso <https://doi.org/10.1109/ETS.2016.7519306>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:title Test-station for flexible semi-automatic wafer-level silicon photonics testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document