[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/DalirsaniHEW11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Atefe_Dalirsani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans-Joachim_Wunderlich>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Melanie_Elm>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stefan_Holst>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETS.2011.33>
foaf:homepage <https://doi.org/10.1109/ETS.2011.33>
dc:identifier DBLP conf/ets/DalirsaniHEW11 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETS.2011.33 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
rdfs:label Structural Test for Graceful Degradation of NoC Switches. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Atefe_Dalirsani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans-Joachim_Wunderlich>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Melanie_Elm>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stefan_Holst>
swrc:pages 183-188 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ets/2011>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ets/DalirsaniHEW11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ets/DalirsaniHEW11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ets/ets2011.html#DalirsaniHEW11>
rdfs:seeAlso <https://doi.org/10.1109/ETS.2011.33>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:subject Network-on-Chip, Graceful Degradation, Performability, Logic Diagnosis (xsd:string)
dc:title Structural Test for Graceful Degradation of NoC Switches. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document