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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/Garcia-GervacioC10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jose_Luis_Garcia-Gervacio>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/V%E2%88%9A%E2%89%A0ctor_H._Champac>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETSYM.2010.5512771>
foaf:homepage <https://doi.org/10.1109/ETSYM.2010.5512771>
dc:identifier DBLP conf/ets/Garcia-GervacioC10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETSYM.2010.5512771 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Computing the detection of Small Delay Defects caused by resistive opens of nanometer ICs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jose_Luis_Garcia-Gervacio>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/V%E2%88%9A%E2%89%A0ctor_H._Champac>
swrc:pages 126-131 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/ETSYM.2010.5512771>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:title Computing the detection of Small Delay Defects caused by resistive opens of nanometer ICs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document