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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/HamdiouiAJC07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Javier_Jim%E2%88%9A%C2%A9nez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jose_Calero>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zaid_Al-Ars>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETS.2007.33>
foaf:homepage <https://doi.org/10.1109/ETS.2007.33>
dc:identifier DBLP conf/ets/HamdiouiAJC07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETS.2007.33 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label PPM Reduction on Embedded Memories in System on Chip. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Javier_Jim%E2%88%9A%C2%A9nez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jose_Calero>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zaid_Al-Ars>
swrc:pages 85-90 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ets/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ets/HamdiouiAJC07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ets/HamdiouiAJC07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ets/ets2007.html#HamdiouiAJC07>
rdfs:seeAlso <https://doi.org/10.1109/ETS.2007.33>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:subject memory testing, static faults, dynamic faults, PPM reduction. (xsd:string)
dc:title PPM Reduction on Embedded Memories in System on Chip. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document