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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/HosseinabadyLNCBP06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alfredo_Benso>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giorgio_Di_Natale>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mohammad_Hosseinabady>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Paolo_Prinetto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pejman_Lotfi-Kamran>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stefano_Di_Carlo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETS.2006.41>
foaf:homepage <https://doi.org/10.1109/ETS.2006.41>
dc:identifier DBLP conf/ets/HosseinabadyLNCBP06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETS.2006.41 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Single-Event Upset Analysis and Protection in High Speed Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alfredo_Benso>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giorgio_Di_Natale>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mohammad_Hosseinabady>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Paolo_Prinetto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pejman_Lotfi-Kamran>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stefano_Di_Carlo>
swrc:pages 29-34 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ets/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ets/HosseinabadyLNCBP06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ets/HosseinabadyLNCBP06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ets/ets2006.html#HosseinabadyLNCBP06>
rdfs:seeAlso <https://doi.org/10.1109/ETS.2006.41>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:title Single-Event Upset Analysis and Protection in High Speed Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document