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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/HungCC23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arjun_Chaudhuri>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Krishnendu_Chakrabarty>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shao-Chun_Hung>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETS56758.2023.10174135>
foaf:homepage <https://doi.org/10.1109/ETS56758.2023.10174135>
dc:identifier DBLP conf/ets/HungCC23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETS56758.2023.10174135 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Test-Point Insertion for Power-Safe Testing of Monolithic 3D ICs using Reinforcement Learning*. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arjun_Chaudhuri>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Krishnendu_Chakrabarty>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shao-Chun_Hung>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ets/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ets/HungCC23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ets/HungCC23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ets/ets2023.html#HungCC23>
rdfs:seeAlso <https://doi.org/10.1109/ETS56758.2023.10174135>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:title Test-Point Insertion for Power-Safe Testing of Monolithic 3D ICs using Reinforcement Learning*. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document