Test Sequence-Optimized BIST for Automotive Applications.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ets/KaczmarekM0RRT20
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Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/ets/KaczmarekM0RRT20
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Bartosz_Kaczmarek
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Grzegorz_Mrugalski
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Janusz_Rajski
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jerzy_Tyszer
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Lukasz_Rybak_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Nilanjan_Mukherjee_0001
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FETS48528.2020.9131585
>
foaf:
homepage
<
https://doi.org/10.1109/ETS48528.2020.9131585
>
dc:
identifier
DBLP conf/ets/KaczmarekM0RRT20
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FETS48528.2020.9131585
(xsd:string)
dcterms:
issued
2020
(xsd:gYear)
rdfs:
label
Test Sequence-Optimized BIST for Automotive Applications.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Bartosz_Kaczmarek
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Grzegorz_Mrugalski
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Janusz_Rajski
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jerzy_Tyszer
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Lukasz_Rybak_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Nilanjan_Mukherjee_0001
>
swrc:
pages
1-6
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/ets/2020
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/ets/KaczmarekM0RRT20/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/ets/KaczmarekM0RRT20
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/ets/ets2020.html#KaczmarekM0RRT20
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ETS48528.2020.9131585
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/ets
>
dc:
title
Test Sequence-Optimized BIST for Automotive Applications.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document