Test challenges in nanometer technologies.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ets/KunduSG00
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/ets/KunduSG00
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Rajesh_Galivanche
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sandip_Kundu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sanjay_Sengupta
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FETW.2000.873783
>
foaf:
homepage
<
https://doi.org/10.1109/ETW.2000.873783
>
dc:
identifier
DBLP conf/ets/KunduSG00
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FETW.2000.873783
(xsd:string)
dcterms:
issued
2000
(xsd:gYear)
rdfs:
label
Test challenges in nanometer technologies.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Rajesh_Galivanche
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sandip_Kundu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sanjay_Sengupta
>
swrc:
pages
83-90
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/ets/2000
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/ets/KunduSG00/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/ets/KunduSG00
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/ets/etw2000.html#KunduSG00
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ETW.2000.873783
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/ets
>
dc:
title
Test challenges in nanometer technologies.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document