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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/KuoLCC99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chung_Len_Lee_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jwu_E._Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sheng-Jer_Kuo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Soon-Jyh_Chang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETW.1999.804228>
foaf:homepage <https://doi.org/10.1109/ETW.1999.804228>
dc:identifier DBLP conf/ets/KuoLCC99 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETW.1999.804228 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
rdfs:label A DFT for semi-DC fault diagnosis for switched-capacitor circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chung_Len_Lee_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jwu_E._Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sheng-Jer_Kuo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Soon-Jyh_Chang>
swrc:pages 58-63 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ets/1999>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ets/KuoLCC99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ets/KuoLCC99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ets/etw1999.html#KuoLCC99>
rdfs:seeAlso <https://doi.org/10.1109/ETW.1999.804228>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:title A DFT for semi-DC fault diagnosis for switched-capacitor circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document