Embedded Tutorial: IC Test Cost Benchmarking. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/ets/Luther07>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Klaus_Luther>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FETS.2007.23>
foaf:homepage	<https://doi.org/10.1109/ETS.2007.23>
dc:identifier	DBLP conf/ets/Luther07 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FETS.2007.23 (xsd:string)
dcterms:issued	2007 (xsd:gYear)
rdfs:label	Embedded Tutorial: IC Test Cost Benchmarking. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Klaus_Luther>
swrc:pages	200 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/ets/2007>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/ets/Luther07/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/ets/Luther07>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/ets/ets2007.html#Luther07>
rdfs:seeAlso	<https://doi.org/10.1109/ETS.2007.23>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:subject	test time, cost, benchmarking, best practice (xsd:string)
dc:title	Embedded Tutorial: IC Test Cost Benchmarking. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document