Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ets/MedeirosFGTPH21
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/ets/MedeirosFGTPH21
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Anteneh_Gebregiorgis
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/G._Cardoso_Medeiros
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Leticia_Bolzani_Poehls
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Moritz_Fieback
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FETS50041.2021.9465441
>
foaf:
homepage
<
https://doi.org/10.1109/ETS50041.2021.9465441
>
dc:
identifier
DBLP conf/ets/MedeirosFGTPH21
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FETS50041.2021.9465441
(xsd:string)
dcterms:
issued
2021
(xsd:gYear)
rdfs:
label
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Anteneh_Gebregiorgis
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/G._Cardoso_Medeiros
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Leticia_Bolzani_Poehls
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Moritz_Fieback
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui
>
swrc:
pages
1-6
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/ets/2021
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/ets/MedeirosFGTPH21/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/ets/MedeirosFGTPH21
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/ets/ets2021.html#MedeirosFGTPH21
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ETS50041.2021.9465441
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/ets
>
dc:
title
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document