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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/Muhmenthaler99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peter_Muhmenthaler>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETW.1999.804519>
foaf:homepage <https://doi.org/10.1109/ETW.1999.804519>
dc:identifier DBLP conf/ets/Muhmenthaler99 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETW.1999.804519 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
rdfs:label Cost effective testing of systems on silicon: areas for optimization. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peter_Muhmenthaler>
swrc:pages 142-143 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ets/1999>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ets/Muhmenthaler99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ets/Muhmenthaler99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ets/etw1999.html#Muhmenthaler99>
rdfs:seeAlso <https://doi.org/10.1109/ETW.1999.804519>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:title Cost effective testing of systems on silicon: areas for optimization. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document