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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/NairMT20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christopher_M%E2%88%9A%C4%BEnch>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mehdi_Baradaran_Tahoori>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sarath_Mohanachandran_Nair>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETS48528.2020.9131582>
foaf:homepage <https://doi.org/10.1109/ETS48528.2020.9131582>
dc:identifier DBLP conf/ets/NairMT20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETS48528.2020.9131582 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christopher_M%E2%88%9A%C4%BEnch>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mehdi_Baradaran_Tahoori>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sarath_Mohanachandran_Nair>
swrc:pages 1-6 (xsd:string)
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owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ets/NairMT20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ets/ets2020.html#NairMT20>
rdfs:seeAlso <https://doi.org/10.1109/ETS48528.2020.9131582>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:title Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document