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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/ObienOF11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marie_Engelene_J._Obien>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Satoshi_Ohtake>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETS.2011.61>
foaf:homepage <https://doi.org/10.1109/ETS.2011.61>
dc:identifier DBLP conf/ets/ObienOF11 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETS.2011.61 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
rdfs:label F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard Full Scan ATPG. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marie_Engelene_J._Obien>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Satoshi_Ohtake>
swrc:pages 203 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ets/2011>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ets/ObienOF11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ets/ObienOF11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ets/ets2011.html#ObienOF11>
rdfs:seeAlso <https://doi.org/10.1109/ETS.2011.61>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:subject automatic test pattern generation, high-level testing, scan-based test (xsd:string)
dc:title F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard Full Scan ATPG. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document