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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/OhlerHW07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans-Joachim_Wunderlich>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Philipp_%E2%88%9A%C4%96hler>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sybille_Hellebrand>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETS.2007.10>
foaf:homepage <https://doi.org/10.1109/ETS.2007.10>
dc:identifier DBLP conf/ets/OhlerHW07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETS.2007.10 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans-Joachim_Wunderlich>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Philipp_%E2%88%9A%C4%96hler>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sybille_Hellebrand>
swrc:pages 91-96 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ets/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ets/OhlerHW07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ets/OhlerHW07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ets/ets2007.html#OhlerHW07>
rdfs:seeAlso <https://doi.org/10.1109/ETS.2007.10>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:title An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document