[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/RenovellGAB02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Florence_Aza%E2%88%9A%C4%AEs>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jean_Marc_Galli%E2%88%9A%C2%AEre>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michel_Renovell>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yves_Bertrand>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETW.2002.1029634>
foaf:homepage <https://doi.org/10.1109/ETW.2002.1029634>
dc:identifier DBLP conf/ets/RenovellGAB02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETW.2002.1029634 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Modeling gate oxide short defects in CMOS minimum transistors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Florence_Aza%E2%88%9A%C4%AEs>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jean_Marc_Galli%E2%88%9A%C2%AEre>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michel_Renovell>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yves_Bertrand>
swrc:pages 15-20 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ets/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ets/RenovellGAB02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ets/RenovellGAB02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ets/etw2002.html#RenovellGAB02>
rdfs:seeAlso <https://doi.org/10.1109/ETW.2002.1029634>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:title Modeling gate oxide short defects in CMOS minimum transistors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document