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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/SantosGTT00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fernando_M._Gon%E2%88%9A%C3%9Falves>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Isabel_C._Teixeira>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jo%E2%88%9A%C2%A3o_Paulo_Teixeira_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marcelino_B._Santos>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETW.2000.873785>
foaf:homepage <https://doi.org/10.1109/ETW.2000.873785>
dc:identifier DBLP conf/ets/SantosGTT00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETW.2000.873785 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label RTL-based functional test generation for high defects coverage in digital SOCs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fernando_M._Gon%E2%88%9A%C3%9Falves>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Isabel_C._Teixeira>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jo%E2%88%9A%C2%A3o_Paulo_Teixeira_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marcelino_B._Santos>
swrc:pages 99-104 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ets/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ets/SantosGTT00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ets/SantosGTT00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ets/etw2000.html#SantosGTT00>
rdfs:seeAlso <https://doi.org/10.1109/ETW.2000.873785>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:title RTL-based functional test generation for high defects coverage in digital SOCs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document