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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/SchulerFC06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daniel_Scain_Farenzena>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erik_Sch%E2%88%9A%C4%BEler>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Luigi_Carro>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETS.2006.19>
foaf:homepage <https://doi.org/10.1109/ETS.2006.19>
dc:identifier DBLP conf/ets/SchulerFC06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETS.2006.19 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Evaluating Sigma-Delta Modulated Signals to Develop Fault-Tolerant Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daniel_Scain_Farenzena>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erik_Sch%E2%88%9A%C4%BEler>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Luigi_Carro>
swrc:pages 137-144 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ets/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ets/SchulerFC06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ets/SchulerFC06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ets/ets2006.html#SchulerFC06>
rdfs:seeAlso <https://doi.org/10.1109/ETS.2006.19>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:title Evaluating Sigma-Delta Modulated Signals to Develop Fault-Tolerant Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document