[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/SeshadriPRK03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bharath_Seshadri>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandip_Kundu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETW.2003.1231681>
foaf:homepage <https://doi.org/10.1109/ETW.2003.1231681>
dc:identifier DBLP conf/ets/SeshadriPRK03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETW.2003.1231681 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label On path selection for delay fault testing considering operating conditions [logic IC testing]. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bharath_Seshadri>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandip_Kundu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
swrc:pages 141-146 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ets/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ets/SeshadriPRK03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ets/SeshadriPRK03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ets/etw2003.html#SeshadriPRK03>
rdfs:seeAlso <https://doi.org/10.1109/ETW.2003.1231681>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:title On path selection for delay fault testing considering operating conditions [logic IC testing]. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document