Avoiding burnt probe tips: Practical solutions for testing internally regulated power supplies.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ets/SwansonWEM14
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/ets/SwansonWEM14
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Amitava_Majumdar_0002
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Anna_Wong
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Richard_Swanson
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Suraj_Ethirajan
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FETS.2014.6847810
>
foaf:
homepage
<
https://doi.org/10.1109/ETS.2014.6847810
>
dc:
identifier
DBLP conf/ets/SwansonWEM14
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FETS.2014.6847810
(xsd:string)
dcterms:
issued
2014
(xsd:gYear)
rdfs:
label
Avoiding burnt probe tips: Practical solutions for testing internally regulated power supplies.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Amitava_Majumdar_0002
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Anna_Wong
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Richard_Swanson
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Suraj_Ethirajan
>
swrc:
pages
1-6
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/ets/2014
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/ets/SwansonWEM14/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/ets/SwansonWEM14
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/ets/ets2014.html#SwansonWEM14
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ETS.2014.6847810
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/ets
>
dc:
title
Avoiding burnt probe tips: Practical solutions for testing internally regulated power supplies.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document