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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/TuduLSA09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erik_Larsson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jaynarayan_T._Tudu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Virendra_Singh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETS.2009.36>
foaf:homepage <https://doi.org/10.1109/ETS.2009.36>
dc:identifier DBLP conf/ets/TuduLSA09 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETS.2009.36 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label On Minimization of Peak Power for Scan Circuit during Test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erik_Larsson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jaynarayan_T._Tudu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Virendra_Singh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
swrc:pages 25-30 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ets/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ets/TuduLSA09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ets/TuduLSA09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ets/ets2009.html#TuduLSA09>
rdfs:seeAlso <https://doi.org/10.1109/ETS.2009.36>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:subject Low power test, Peak Power, Power droop, Test vector re-ordering (xsd:string)
dc:title On Minimization of Peak Power for Scan Circuit during Test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document