Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ets/TuduLSF10
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/ets/TuduLSF10
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Erik_Larsson
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jaynarayan_T._Tudu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Virendra_Singh
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FETSYM.2010.5512732
>
foaf:
homepage
<
https://doi.org/10.1109/ETSYM.2010.5512732
>
dc:
identifier
DBLP conf/ets/TuduLSF10
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FETSYM.2010.5512732
(xsd:string)
dcterms:
issued
2010
(xsd:gYear)
rdfs:
label
Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Erik_Larsson
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jaynarayan_T._Tudu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Virendra_Singh
>
swrc:
pages
259
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/ets/2010
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/ets/TuduLSF10/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/ets/TuduLSF10
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/ets/ets2010.html#TuduLSF10
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ETSYM.2010.5512732
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/ets
>
dc:
title
Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document