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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Elena_I._Vatajelu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Luigi_Dilillo>
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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETS.2013.6569373>
foaf:homepage <https://doi.org/10.1109/ETS.2013.6569373>
dc:identifier DBLP conf/ets/VatajeluBDGTVB13 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETS.2013.6569373 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
rdfs:label Analyzing resistive-open defects in SRAM core-cell under the effect of process variability. (xsd:string)
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nabil_Badereddine>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
swrc:pages 1-6 (xsd:string)
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dc:title Analyzing resistive-open defects in SRAM core-cell under the effect of process variability. (xsd:string)
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rdf:type swrc:InProceedings
rdf:type foaf:Document