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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ets/XunFYZTH23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hanzhi_Xun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Moritz_Fieback>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sicong_Yuan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ziwei_Zhang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FETS56758.2023.10174106>
foaf:homepage <https://doi.org/10.1109/ETS56758.2023.10174106>
dc:identifier DBLP conf/ets/XunFYZTH23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FETS56758.2023.10174106 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hanzhi_Xun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Moritz_Fieback>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sicong_Yuan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ziwei_Zhang>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ets/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ets/XunFYZTH23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ets/XunFYZTH23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ets/ets2023.html#XunFYZTH23>
rdfs:seeAlso <https://doi.org/10.1109/ETS56758.2023.10174106>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ets>
dc:title Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document