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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/eurodac/ChenG94>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chih-Ang_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandeep_K._Gupta_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FEDTC.1994.326862>
foaf:homepage <https://doi.org/10.1109/EDTC.1994.326862>
dc:identifier DBLP conf/eurodac/ChenG94 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FEDTC.1994.326862 (xsd:string)
dcterms:issued 1994 (xsd:gYear)
rdfs:label BIST Test Pattern Generators for Stuck-Open and Delay Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chih-Ang_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandeep_K._Gupta_0001>
swrc:pages 289-296 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/eurodac/1994edac>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/eurodac/ChenG94/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/eurodac/ChenG94>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/eurodac/eurodac1994.html#ChenG94>
rdfs:seeAlso <https://doi.org/10.1109/EDTC.1994.326862>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/eurodac>
dc:title BIST Test Pattern Generators for Stuck-Open and Delay Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document