Fault modelling and fault equivalence in CMOS technology.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/eurodac/FlottesLP90
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/eurodac/FlottesLP90
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Christian_Landrault
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Marie-Lise_Flottes
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Serge_Pravossoudovitch
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FEDAC.1990.136682
>
foaf:
homepage
<
https://doi.org/10.1109/EDAC.1990.136682
>
dc:
identifier
DBLP conf/eurodac/FlottesLP90
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FEDAC.1990.136682
(xsd:string)
dcterms:
issued
1990
(xsd:gYear)
rdfs:
label
Fault modelling and fault equivalence in CMOS technology.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Christian_Landrault
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Marie-Lise_Flottes
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Serge_Pravossoudovitch
>
swrc:
pages
407-412
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/eurodac/1990
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/eurodac/FlottesLP90/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/eurodac/FlottesLP90
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/eurodac/euro-dac1990.html#FlottesLP90
>
rdfs:
seeAlso
<
https://doi.org/10.1109/EDAC.1990.136682
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/eurodac
>
dc:
subject
Fault collapsing, Fault modelling, Test pattern generation
(xsd:string)
dc:
title
Fault modelling and fault equivalence in CMOS technology.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document