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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/eurodac/KrsticCC96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Angela_Krstic>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kwang-Ting_Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Srimat_T._Chakradhar>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FEURDAC.1996.558208>
foaf:homepage <https://doi.org/10.1109/EURDAC.1996.558208>
dc:identifier DBLP conf/eurodac/KrsticCC96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FEURDAC.1996.558208 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Testable path delay fault cover for sequential circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Angela_Krstic>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kwang-Ting_Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Srimat_T._Chakradhar>
swrc:pages 220-226 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/eurodac/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/eurodac/KrsticCC96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/eurodac/KrsticCC96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/eurodac/euro-dac1996.html#KrsticCC96>
rdfs:seeAlso <https://doi.org/10.1109/EURDAC.1996.558208>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/eurodac>
dc:title Testable path delay fault cover for sequential circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document