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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/eurodac/SousaGTW94>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fernando_M._Gon%E2%88%9A%C3%9Falves>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jo%E2%88%9A%C2%A3o_Paulo_Teixeira_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_T._de_Sousa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_W._Williams>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FEDTC.1994.326839>
foaf:homepage <https://doi.org/10.1109/EDTC.1994.326839>
dc:identifier DBLP conf/eurodac/SousaGTW94 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FEDTC.1994.326839 (xsd:string)
dcterms:issued 1994 (xsd:gYear)
rdfs:label Fault Modeling and Defect Level Projections in Digital ICs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fernando_M._Gon%E2%88%9A%C3%9Falves>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jo%E2%88%9A%C2%A3o_Paulo_Teixeira_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_T._de_Sousa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_W._Williams>
swrc:pages 436-442 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/eurodac/1994edac>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/eurodac/SousaGTW94/dblp>
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rdfs:seeAlso <https://doi.org/10.1109/EDTC.1994.326839>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/eurodac>
dc:title Fault Modeling and Defect Level Projections in Digital ICs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document