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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/euromicro/BifflH00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Halling>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stefan_Biffl>
foaf:homepage <http://dx.doi.org/doi.ieeecomputersociety.org%2F10.1109%2FEUROMICRO.2000.10008>
foaf:homepage <https://doi.ieeecomputersociety.org/10.1109/EUROMICRO.2000.10008>
dc:identifier DBLP conf/euromicro/BifflH00 (xsd:string)
dc:identifier DOI doi.ieeecomputersociety.org%2F10.1109%2FEUROMICRO.2000.10008 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Software Product Improvement with Inspection. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Halling>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stefan_Biffl>
swrc:pages 2262-2269 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/euromicro/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/euromicro/BifflH00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/euromicro/BifflH00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/euromicro/euromicro2000.html#BifflH00>
rdfs:seeAlso <https://doi.ieeecomputersociety.org/10.1109/EUROMICRO.2000.10008>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/euromicro>
dc:subject Software inspection process, defect detection techniques, quality measurement, controlled experiment, empirical software engineering (xsd:string)
dc:title Software Product Improvement with Inspection. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document